Huaxiang Yin: search on Z-Library

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1

Study of SiGe selective epitaxial process integration with high-k and metal gate for 16/14nm nodes FinFET technology

Wang, Guilei, Qin, Changliang, Yin, Huaxiang, Luo, Jun, Duan, Ningyuan, Yang, Ping, Gao, Xingyu, Yang, Tao, Li, Junfeng, Yan, Jiang, Zhu, Huilong, Wang, Wenwu, Chen, Dapeng, Ye, Tianchun, Zhao, Chao,

Journal:

Microelectronic Engineering

Year:

2016

Language:

english

File:

PDF, 1.28 MB

english, 2016

2

Humidity-responsive nanocomposite of gold nanoparticles and polyacrylamide brushes grafted on Ag film: synthesis and application as plasmonic nanosensor; 湿度响应纳米复合材料的组装及其SERS传感器应用;

Chen, Huaxiang, You, Tingting, Xu, Geng, Gao, Yukun, Zhang, Chenmeng, Yang, Nan, Yin, Penggang

Journal:

Science China Materials

Year:

2018

Language:

english

File:

PDF, 2.16 MB

english, 2018

3

Novel GAA Si Nanowire p-MOSFETs with Excellent Short Channel Effect Immunity via an Advanced Forming Process

Zhang, Qingzhu, Yin, Huaxiang, Meng, Lingkuan, Yao, Jiaxin, Li, Junjie, Wang, Guilei, li, Yudong, Wu, Zhenhua, Xiong, Wenjuan, Yang, Hong, Tu, Hailing, Li, Junfeng, Zhao, Chao, Wang, Wenwu, Ye, Tianch

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 596 KB

english, 2018

4

An experimental study on the recovery of potassium (K) and phosphorous (P) from synthetic urine by crystallization of magnesium potassium phosphate

Gao, Yukun, Liang, Benliang, Chen, Huaxiang, Yin, Penggang

Journal:

Chemical Engineering Journal

Year:

2018

Language:

english

File:

PDF, 2.05 MB

english, 2018

5

A High Density and Low Cost Staircase Scheme for 3D NAND Flash Memory: SDS(Stair Divided Scheme)

Hong, Peizhen, Xia, Zhiliang, Yin, Huaxiang, Li, Chunlong, Huo, Zongliang

Journal:

ECS Journal of Solid State Science and Technology

Year:

2019

Language:

english

File:

PDF, 812 KB

english, 2019

6

Study of sigma-shaped source/drain recesses for embedded-SiGe pMOSFETs

Qin, Changliang, Yin, Huaxiang, Wang, Guilei, Hong, Peizhen, Ma, Xiaolong, Cui, Hushan, Lu, Yihong, Meng, Lingkuan, Yin, Haizhou, Zhong, Huicai, Yan, Jiang, Zhu, Huilong, Xu, Qiuxia, Li, Junfeng, Zhao

Journal:

Microelectronic Engineering

Year:

2017

Language:

english

File:

PDF, 2.67 MB

english, 2017

7

Near-ideal subthreshold swing MoS2 back-gate transistors with an optimized ultrathin HfO2 dielectric layer

Pan, Yu, Jia, Kunpeng, Huang, Kailiang, Wu, Zhenhua, Bai, Guobin, Yu, Jiahan, Zhang, Zhaohao, Zhang, Qungzhu, Yin, Huaxiang

Journal:

Year:

2018

Language:

english

File:

PDF, 1.44 MB

english, 2018

8

[IEEE 2013 IEEE 10th International Conference on Group IV Photonics (GFP) - Seoul, Korea (South) (2013.08.28-2013.08.30)] 10th International Conference on Group IV Photonics - Compact and wideband optical 90° hybrid based on silicon-on-insulator

Yin, Mei, Yang, Wei, Huang, Yawen, Yi, Huaxiang, Li, Yanping, Wang, Xingjun, Li, Hongbin

Year:

2013

Language:

english

File:

PDF, 464 KB

english, 2013

9

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - High performance oxide thin film transistors with double active layers

Sun Il Kim,, Chang Jung Kim,, Jae Chul Park,, Ihun Song,, Sang Wook Kim,, Huaxiang Yin,, Eunha Lee,, Jae Chul Lee,, Youngsoo Park,

Year:

2008

Language:

english

File:

PDF, 473 KB

english, 2008

10

Performance Enhancement for Charge Trapping Memory by Using Al 2 O 3 /HfO 2 /Al 2 O 3 Tri-Layer High-κ Dielectrics and High Work Function Metal Gate

Hou, Zhaozhao, Wu, Zhenhua, Yin, Huaxiang

Journal:

ECS Journal of Solid State Science and Technology

Year:

2018

Language:

english

File:

PDF, 1.02 MB

english, 2018

11

Understanding Frequency Dependence of Trap Generation under AC Negative Bias Temperature Instability Stress in Si p-FinFETs

Zhou, Longda, Zhang, Qingzhu, Yang, Hong, Ji, Zhigang, Zhang, Zhaohao, Liu, Qianqian, Xu, Hao, Tang, Bo, Simoen, Eddy, Ma, Xueli, Wang, Xiaolei, Li, Yongliang, Yin, Huaxiang, Luo, Jun, Zhao, Chao, Wan

Journal:

IEEE Electron Device Letters

Year:

2020

File:

PDF, 370 KB

2020

12

FinFET with Improved Subthreshold Swing and Drain Current using 3 nm Ferroelectric Hf0.5Zr0.5O2

Zhang, Zhaohao, Xu, Gaobo, Zhang, Qingzhu, Hou, Zhaozhao, Li, Junjie, Kong, Zhenzhen, Zhang, Yongkui, Xiang, Jinjuan, Xu, Qiuxia, Wu, Zhenhua, Zhu, Huilong, Yin, Huaxiang, Wang, Wenwu, Ye, Tianchun

Journal:

IEEE Electron Device Letters

Year:

2019

Language:

english

File:

PDF, 563 KB

english, 2019

13

Silicon photonics for advanced optical communication systems

Zhou, Zhiping, Wang, Xingjun, Yi, Huaxiang, Tu, Zhijuan, Tan, Wei, Long, Qifeng, Yin, Mei, Huang, Yawen

Journal:

Optical Engineering

Year:

2013

Language:

english

File:

PDF, 2.46 MB

english, 2013

14

[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Physical Mechanism Underlying the Time Exponent Shift in the Ultra-fast NBTI of High-k/Metal gated p-CMOSFETs

ZhOU, Longda, Tang, Bo, Yang, Hong, Xu, Hao, Li, Yongliang, Simoen, Eddy, Yin, Huaxiang, Zhu, Huilong, Zhao, Chao, Wang, Wenwu, Chen, Dapeng, Ye, Tianchun

Year:

2018

Language:

english

File:

PDF, 719 KB

english, 2018

15

Influence of an ALD TiN capping layer on the PBTI characteristics of n-FinFET with ALD HfO2/TiN-capping/TiAl gate stacks

Yang, Hong, Qi, Luwei, Zhang, Yanbo, Tang, Bo, Liu, Qianqian, Xu, Hao, Ma, Xueli, Wang, Xiaolei, Li, Yongliang, Yin, Huaxiang, Li, Junfeng, Zhu, Huilong, Zhao, Chao, Wang, Wenwu, Ye, Tianchun

Journal:

SCIENCE CHINA Information Sciences

Year:

2020

File:

PDF, 144 KB

2020

16

Metal gate etch-back planarization technology

Meng, Lingkuan, Yin, Huaxiang, Chen, Dapeng, Ye, Tianchun

Journal:

Journal of Semiconductors

Year:

2012

Language:

english

File:

PDF, 543 KB

english, 2012

17

Heavy ion induced single-event-transient effects in nano-scale ferroelectric vertical tunneling transistors by TCAD simulation

Tian, Guoliang, Bi, Jinshun, Xu, Gaobo, Xi, Kai, Yang, Xueqin, Yin, Huaxiang, Xu, Qiuxia, Wang, Wenwu

Journal:

Semiconductor Science and Technology

Year:

2020

File:

PDF, 1.68 MB

2020

18

[IEEE 6th International Conference on Solid-State and IC Technology - Shanghai, China (22-25 Oct. 2001)] 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) - Design considerations of the sub-50 nm self-aligned double gate MOSFET with a new channel doping profile

Yin Huaxiang,, Xu Qiuxia,

Year:

2001

Language:

english

File:

PDF, 247 KB

english, 2001

19

[IEEE 6th International Conference on Solid-State and IC Technology - Shanghai, China (22-25 Oct. 2001)] 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) - High performance 70 nm CMOS device and key technologies

Xu Qiuxia,, Qian He,, Yin Huaxiang,, Jia Lin,, Ji Honghao,, Chen Baoqin,, Zhu Yajiang,, Liu Min,

Year:

2001

Language:

english

File:

PDF, 342 KB

english, 2001

20

The effects of process condition of top-TiN and TaN thickness on the effective work function of MOSCAP with high- k /metal gate stacks

Ma, Xueli, Yang, Hong, Wang, Wenwu, Yin, Huaxiang, Zhu, Huilong, Zhao, Chao, Chen, Dapeng, Ye, Tianchun

Journal:

Journal of Semiconductors

Year:

2014

Language:

english

File:

PDF, 1.04 MB

english, 2014

21

Physical Insights on Quantum Confinement and Carrier Mobility in Si, Si₀ٜ₄₅Ge₀ٜ₅₅, Ge Gate-All-Around NSFET for 5nm Technology Node

Yao, Jiaxin, Li, Jun, Luo, Kun, Yu, Jiahan, Zhang, Qingzhu, Hou, Zhaozhao, Gu, Jie, Yang, Wen, Wu, Zhenhua, Yin, Huaxiang, Wang, Wenwu

Journal:

IEEE Journal of the Electron Devices Society

Year:

2018

Language:

english

File:

PDF, 1.36 MB

english, 2018

22

Double gate GaInZnO thin film transistors

Lim, Hyuck, Yin, Huaxiang, Park, Jin-Seong, Song, Ihun, Kim, Changjung, Park, JaeChul, Kim, SunIl, Kim, Sang-Wook, Lee, Chang Bum, Kim, Yong C., Park, Young Soo, Kang, Donghun

Journal:

Applied Physics Letters

Year:

2008

Language:

english

File:

PDF, 597 KB

english, 2008

23

Novel Insulator Isolated Si NW Sensors Fabricated using Bulk Substrate with Low-cost and High-quality

Zhang, Qingzhu, Liu, Ruonan, Tu, Hailing, Tang, Siqi, Yan, Jiang, Li, Bo, Zhang, Jing, Zhang, Zhaohao, Wei, Qianhui, Yin, Huaxiang

Journal:

Journal of Physics Conference Series

Year:

2020

File:

PDF, 778 KB

2020

24

Investigation for the Feasibility of High-Mobility Channel in 3D NAND Memory

Hou, Zhaozhao, Yao, Jiaxin, Wu, Zhenhua, Yin, Huaxiang

Journal:

ECS Journal of Solid State Science and Technology

Year:

2018

Language:

english

File:

PDF, 975 KB

english, 2018

25

Two methods of tuning threshold voltage of bulk FinFETs with replacement high-k metal-gate stacks

Xu, Miao, Zhu, Huilong, Zhang, Yanbo, Xu, Qiuxia, Zhang, Yongkui, Qin, Changliang, Zhang, Qingzhu, Yin, Huaxiang, Xu, Hao, Chen, Shuai, Luo, Jun, Li, Chunlong, Zhao, Chao, Ye, Tianchun

Journal:

Solid-State Electronics

Year:

2017

Language:

english

File:

PDF, 1.42 MB

english, 2017

26

Optimization of Selective Growth of SiGe for Source/Drain in 14nm and Beyond Nodes FinFETs

Radamson, Henry H., Luo, Jun, Qin, Changliang, Yin, Huaxiang, Zhu, Huilong, Zhao, Chao, Wang, Guilei

Journal:

International Journal of High Speed Electronics and Systems

Year:

2017

Language:

english

File:

PDF, 1.24 MB

english, 2017

27

Fabrication of Low Cost and Low Temperature Poly-Silicon Nanowire Sensor Arrays for Monolithic Three-Dimensional Integrated Circuits Applications

Tang, Siqi, Yan, Jiang, Zhang, Jing, Wei, Shuhua, Zhang, Qingzhu, Li, Junjie, Fang, Min, Zhang, Shuang, Xiong, Enyi, Wang, Yanrong, Yang, Jianglan, Zhang, Zhaohao, Wei, Qianhui, Yin, Huaxiang, Wang, W

Journal:

Year:

2020

File:

PDF, 7.10 MB

2020

28

ECS Transactions [ECS China Semiconductor Technology International Conference 2011 (CSTIC 2011) - Shanghai, China (March 13 - March 14, 2011)] - Dummy Poly Silicon Gate Removal by Wet Chemical Etching

Young, Tao, Yin, Huaxiang, Xu, Qiuxia, Zhao, Chao, Li, Jun Feng, Chen, Dapeng

Year:

2011

Language:

english

File:

PDF, 381 KB

english, 2011

29

Comprehensive Study and Design of High-k/SiGe Gate Stacks with Interface-Engineering by Ozone Oxidation

Ma, Xueli, Xiang, Jinjuan, Zhou, Lixing, Wang, Xiaolei, Li, Yongliang, Yang, Hong, Zhang, Jing, Zhao, Chao, Yin, Huaxiang, Wang, Wenwu, Ye, Tianchun

Journal:

ECS Journal of Solid State Science and Technology

Year:

2019

Language:

english

File:

PDF, 1.10 MB

english, 2019

30

Integration of highly-strained SiGe materials in 14nm and beyond nodes FinFET technology

Wang, Guilei, Abedin, Ahmad, Moeen, Mahdi, Kolahdouz, Mohammadreza, Luo, Jun, Guo, Yiluan, Chen, Tao, Yin, Huaxiang, Zhu, Huilong, Li, Junfeng, Zhao, Chao, Radamson, Henry H.

Journal:

Solid-State Electronics

Year:

2015

Language:

english

File:

PDF, 1.35 MB

english, 2015

31

Impact of ALD TiN Capping Layer on Interface Trap and Channel Hot Carrier Reliability of HKMG nMOSFETs

Yang, Hong, Luo, Weichun, Zhou, Longda, Xu, Hao, Tang, Bo, Simoen, Eddy, Yin, Huaxiang, Zhu, Huilong, Zhao, Chao, Wang, Wenwu, Ye, Tianchun

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 295 KB

english, 2018

32

Multi-Vt Performance Dependence on Capping Layer Position by NPT for PMOS Device Applications

Yao, Jiaxin, Wu, Zhenhua, Yin, Huaxiang

Journal:

ECS Journal of Solid State Science and Technology

Year:

2019

Language:

english

File:

PDF, 1.29 MB

english, 2019

33

Electrical Capacitance Tomography With Differential Sensor

Cui, Ziqiang, Wang, Huaxiang, Yin, Wuliang

Journal:

IEEE Sensors Journal

Year:

2015

Language:

english

File:

PDF, 1.88 MB

english, 2015

34

An effective work-function tuning method of nMOSCAP with high- k /metal gate by TiN/TaN double-layer stack thickness

Ma, Xueli, Yang, Hong, Wang, Wenwu, Yin, Huaxiang, Zhu, Huilong, Zhao, Chao, Chen, Dapeng, Ye, Tianchun

Journal:

Journal of Semiconductors

Year:

2014

Language:

english

File:

PDF, 3.50 MB

english, 2014

35

Fabrication of Bulk-Si FinFET using CMOS compatible process

Huajie Zhou, Yi Song, Qiuxia Xu, Yongliang Li, Huaxiang Yin

Journal:

Microelectronic Engineering

Year:

2012

Language:

english

File:

PDF, 629 KB

english, 2012

36

Insights into the Effect of TiN Thickness Scaling on DC and AC NBTI Characteristics in Replacement Metal Gate pMOSFETs

Zhou, Longda, Liu, Qianqian, Yang, Hong, Ji, Zhigang, Xu, Hao, Tang, Bo, Simoen, Eddy, Jiang, Haojie, Luo, Ying, Wang, Xiaolei, Ma, Xueli, Li, Yongliang, Luo, Jun, Yin, Huaxiang, Zhao, Chao, Wang, Wen

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2020

File:

PDF, 627 KB

2020

37

Integration of Highly Strained SiGe in Source and Drain with HK and MG for 22 nm Bulk PMOS Transistors

Wang, Guilei, Luo, Jun, Qin, Changliang, Liang, Renrong, Xu, Yefeng, Liu, Jinbiao, Li, Junfeng, Yin, Huaxiang, Yan, Jiang, Zhu, Huilong, Xu, Jun, Zhao, Chao, Radamson, Henry H., Ye, Tianchun

Journal:

Nanoscale Research Letters

Year:

2017

Language:

english

File:

PDF, 2.37 MB

english, 2017

38

Nanometer-Scale Oxide Thin Film Transistor with Potential for High-Density Image Sensor Applications

Jeon, Sanghun, Park, Sungho, Song, Ihun, Hur, Ji-Hyun, Park, Jaechul, Kim, Hojung, Kim, Sunil, Kim, Sangwook, Yin, Huaxiang, Chung, U−In, Lee, Eunha, Kim, Changjung

Journal:

ACS Applied Materials & Interfaces

Year:

2011

Language:

english

File:

PDF, 306 KB

english, 2011

39

High-performance amorphous gallium indium zinc oxide thin-film transistors through N[sub 2]O plasma passivation

Park, Jaechul, Kim, Sangwook, Kim, Changjung, Kim, Sunil, Song, Ihun, Yin, Huaxiang, Kim, Kyoung-Kok, Lee, Sunghoon, Hong, Kiha, Lee, Jaecheol, Jung, Jaekwan, Lee, Eunha, Kwon, Kee-Won, Park, Youngsoo

Journal:

Applied Physics Letters

Year:

2008

Language:

english

File:

PDF, 561 KB

english, 2008

40

A study of the detection mechanism and the reconstruction algorithm for multi-phase interface level measurement

Wang, HuaXiang, Yin, WuLiang

Journal:

Measurement Science and Technology

Year:

1997

Language:

english

File:

PDF, 152 KB

english, 1997

41

Accumulative total ionizing dose (TID) and transient dose rate (TDR) effects on planar and vertical ferroelectric tunneling-field-effect-transistors (TFET)

Yan, Gangping, Xu, Gaobo, Bi, Jinshun, Tian, Guoliang, Xu, Qiuxia, Yin, Huaxiang, Li, Yongliang

Journal:

Microelectronics Reliability

Year:

2020

File:

PDF, 1.22 MB

2020

42

Program/Erase Characteristics of Amorphous Gallium Indium Zinc Oxide Nonvolatile Memory

Huaxiang Yin, Sunil Kim, Hyuck Lim, Yosep Min, Chang Jung Kim, Ihun Song, Jaechul Park, Sang-Wook Kim, Tikhonovsky, A., Jaewoong Hyun, Youngsoo Park

Journal:

IEEE Transactions on Electron Devices

Year:

2008

Language:

english

File:

PDF, 894 KB

english, 2008

43

ECS Transactions [ECS China Semiconductor Technology International Conference 2012 (CSTIC 2012) - Shanghai, China (March 18 - March 19, 2012)] - The Impact of Isolation Methods on Device Characteristics in Bulk FinFET Using TCAD Simulation

Ren, Zhe, Yin, Huaxiang

Year:

2012

Language:

english

File:

PDF, 275 KB

english, 2012

44

ECS Transactions [ECS China Semiconductor Technology International Conference 2012 (CSTIC 2012) - Shanghai, China (March 18 - March 19, 2012)] - CMP-less ILD0 Planarization Technology for Gate-Last Process

Meng, Lingkuan, Yin, Huaxiang

Year:

2012

Language:

english

File:

PDF, 386 KB

english, 2012

45

A Maximal Clique Based Multiobjective Evolutionary Algorithm for Overlapping Community Detection

Wen, Xuyun, Chen, Wei-Neng, Lin, Ying, Gu, Tianlong, Zhang, Huaxiang, Li, Yun, Yin, Yilong, Zhang, Jun

Journal:

IEEE Transactions on Evolutionary Computation

Year:

2016

Language:

english

File:

PDF, 1.26 MB

english, 2016

46

Numerical Study of the Formation of Shear Bands in Soil under Interface Shearing

Zhu, Huaxiang, Zhou, Wan-Huan, Jing, Xue-Ying, Yin, Zhen-Yu

Journal:

Procedia Engineering

Year:

2017

Language:

english

File:

PDF, 2.93 MB

english, 2017

47

ECS Transactions [ECS China Semiconductor Technology International Conference 2012 (CSTIC 2012) - Shanghai, China (March 18 - March 19, 2012)] - Characterization of Tetrahedral Amorphous Carbon (Ta-C) Thin Films with >6GPa Compressive Stress and Application in Sub-32nm p-MOSFET Strain Engineering

Ma, Xiaolong, Fu, Zuozhen, Yin, Huaxiang, Zhang, Haiqiang, Zhang, Xu

Year:

2012

Language:

english

File:

PDF, 210 KB

english, 2012

48

Growth of SiGe layers in source and drain regions for 10 nm node complementary metal-oxide semiconductor (CMOS)

Wang, Guilei, Kolahdouz, M., Luo, Jun, Qin, Changliang, Gu, Shihai, Kong, Zhenzhen, Yin, Xiaogen, Xiong, Wenjuan, Zhao, Xuewei, Liu, Jinbiao, Yang, Tao, Li, Junfeng, Yin, Huaxiang, Zhu, Huilong, Wang,

Journal:

Journal of Materials Science: Materials in Electronics

Year:

2019

Language:

english

File:

PDF, 2.27 MB

english, 2019

49

[IEEE 2011 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Hangzhou, China (2011.05.10-2011.05.12)] 2011 IEEE International Instrumentation and Measurement Technology Conference - In line estimation of the group delay due to pipeline ADCs in mixed signal system

Chen, Lijing, Chen, Guang, Wang, Huaxiang, Yin, Wuliang

Year:

2011

Language:

english

File:

PDF, 219 KB

english, 2011

50

MDSCs drive the process of endometriosis by enhancing angiogenesis and are a new potential therapeutic target

Zhang, Tao, Zhou, Juhua, Man, Gene Chi Wai, Leung, Kam Tong, Liang, Bo, Xiao, Bo, Ma, Xinting, Huang, Shaoyan, Huang, Huaxiang, Hegde, Venkatesh L., Zhong, Yin, Li, Yanmin, Kong, Grace Wing Shan, Yiu,

Journal:

European Journal of Immunology

Year:

2018

Language:

english

File:

PDF, 1.85 MB

english, 2018

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